Enhanced feedback performance in off-resonance AFM modes through pulse train sampling

• Mustafa Kangül,
• Navid Asmari,
• Santiago H. Andany,
• Marcos Penedo and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13

• Mustafa Kangul Navid Asmari Santiago H. Andany Marcos Penedo Georg E. Fantner Laboratory for Bio- and Nano-Instrumentation, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne CH-1015, Switzerland 10.3762/bjnano.15.13 Abstract Dynamic atomic force microscopy (AFM) modes that operate

Quantitative dynamic force microscopy with inclined tip oscillation

• Philipp Rahe,
• Daniel Heile,
• Reinhard Olbrich and
• Michael Reichling

Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53

• Philipp Rahe Daniel Heile Reinhard Olbrich Michael Reichling Fachbereich Physik, Universität Osnabrück, Barbarastrasse 7, 49076 Osnabrück, Germany 10.3762/bjnano.13.53 Abstract In the mathematical description of dynamic atomic force microscopy (AFM), the relation between the tip–surface normal

• established mathematical description for dynamic atomic force microscopy [3] by including free orientations of the tip sampling and data recording paths. The resulting formulae are discussed and implications for precise force measurements [2] are identified and quantified. Most importantly, the data

On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges

• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 1409–1418, doi:10.3762/bjnano.11.125

• help inform dynamic AFM characterization. Keywords: dynamic atomic force microscopy; Generalized Maxwell model; loss modulus; storage modulus; viscoelasticity; Introduction There have been significant methodology developments since the introduction of atomic force microscopy (AFM) in the mid-1980s [1

Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

• Zahra Abooalizadeh,
• Leszek Josef Sudak and
• Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

• Zahra Abooalizadeh Leszek Josef Sudak Philip Egberts Department of Mechanical and Manufacturing Engineering, University of Calgary, 40 Research Place NW, Calgary, Alberta T2L 1Y6, Canada 10.3762/bjnano.10.132 Abstract Dynamic atomic force microscopy (AFM) was employed to spatially map the elastic

• , and predictive models of failure. Dynamic atomic force microscopy (AFM) is one technique that is well suited for experimentally measuring the mechanical properties of materials with high spatial resolution [10][11][12]. More specifically, a focus on two dynamic AFM modes, force modulation microscopy

In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy

• Jesús S. Lacasa,
• Lisa Almonte and
• Jaime Colchero

Beilstein J. Nanotechnol. 2018, 9, 2925–2935, doi:10.3762/bjnano.9.271

• the measured properties of the tip–sample system can be uniquely attributed to the sample. Experimental AFM data acquisition and processing AFM imaging Data was acquired using dynamic atomic force microscopy (DAFM) on a Nanotec Electronica AFM system with a phase-locked loop board (PLL, bandwidth ca

Electrostatically actuated encased cantilevers

• Benoit X. E. Desbiolles,
• Gabriela Furlan,
• Adam M. Schwartzberg,
• Paul D. Ashby and
• Dominik Ziegler

Beilstein J. Nanotechnol. 2018, 9, 1381–1389, doi:10.3762/bjnano.9.130

• , or vacuum environments. Keywords: amplitude calibration; atomic force microscopy; electrostatic excitation; encased cantilevers; liquid AFM; Introduction Dynamic atomic force microscopy requires excitation of the cantilever oscillation. Most commonly, this is achieved using a dither piezo built

Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

• Mykola Telychko,
• Jan Berger,
• Zsolt Majzik,
• Pavel Jelínek and
• Martin Švec

Beilstein J. Nanotechnol. 2015, 6, 901–906, doi:10.3762/bjnano.6.93

• . For the first time we bring experimental data, that can distinguish the topographic landscape from the local electronic structure of SLG on a 6H-SiC(0001) substrate. At room temperature we employed a combined STM and dynamic atomic force microscopy (dAFM) based on the Q-plus sensor working under UHV

Influence of spurious resonances on the interaction force in dynamic AFM

• Luca Costa and
• Mario S. Rodrigues

Beilstein J. Nanotechnol. 2015, 6, 420–427, doi:10.3762/bjnano.6.42

• ; amplitude modulation; atomic force microscopy; fluid borne excitation; interferometric detection; laser-beam detection; spurious resonances; Introduction Dynamic atomic force microscopy (AFM) was introduced in the late 1980s [1] as the natural evolution of the first atomic force microscopes [2]. Thanks to

Dissipation signals due to lateral tip oscillations in FM-AFM

• Michael Klocke and
• Dietrich E. Wolf

Beilstein J. Nanotechnol. 2014, 5, 2048–2057, doi:10.3762/bjnano.5.213

• Michael Klocke Dietrich E. Wolf Department of Physics, University of Duisburg-Essen and CeNIDE, D-47048 Duisburg, Germany 10.3762/bjnano.5.213 Abstract We study the coupling of lateral and normal tip oscillations and its effect on the imaging process of frequency-modulated dynamic atomic force

• microscopy. The coupling is induced by the interaction between tip and surface. Energy is transferred from the normal to the lateral excitation, which can be detected as damping of the cantilever oscillation. However, energy can be transferred back into the normal oscillation, if not dissipated by the

Energy dissipation in multifrequency atomic force microscopy

• Valentina Pukhova,
• Francesco Banfi and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2014, 5, 494–500, doi:10.3762/bjnano.5.57

• ; wavelet transforms; Introduction Multifrequency dynamic atomic force microscopy [1] is a powerful technique to retrieve quantitative information on materials properties such as the elastic constants and the sample chemical environment with a lateral resolution in the nanometer range. In this context the

Unlocking higher harmonics in atomic force microscopy with gentle interactions

• Sergio Santos,
• Victor Barcons,
• Josep Font and
• Albert Verdaguer

Beilstein J. Nanotechnol. 2014, 5, 268–277, doi:10.3762/bjnano.5.29

• (Barcelona), Spain CSIC - Consejo Superior de Investigaciones Cientificas, ICN2 Building ,08193 Bellaterra (Barcelona), Spain 10.3762/bjnano.5.29 Abstract In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal

• ; Introduction It has long been recognized in the community that higher harmonics encode detailed information about the non-linearities of the tip–sample interaction in dynamic atomic force microscopy (AFM) [1][2][3][4][5]. Physically, non-linearities relate to the chemical and mechanical composition [6] of the

High-resolution nanomechanical analysis of suspended electrospun silk fibers with the torsional harmonic atomic force microscope

• Mark Cronin-Golomb and
• Ozgur Sahin

Beilstein J. Nanotechnol. 2013, 4, 243–248, doi:10.3762/bjnano.4.25

• reliable method to investigate the mechanics of materials with complex geometries. Keywords: atomic force microscopy; nanomechanical characterization; silk fibers; tissue scaffolds; torsional harmonic cantilevers; Introduction Dynamic atomic force microscopy (AFM) methods provide opportunities for high

High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

• John Melcher,
• David Martínez-Martín,
• Miriam Jaafar,
• Julio Gómez-Herrero and
• Arvind Raman

Beilstein J. Nanotechnol. 2013, 4, 153–163, doi:10.3762/bjnano.4.15

• Materia Condensada C-III, Universidad Autónoma de Madrid, 28049 Madrid, Spain School of Mechanical Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN 47907 10.3762/bjnano.4.15 Abstract The recent achievement of atomic resolution with dynamic atomic force microscopy (dAFM

• under similar operating conditions. Keywords: atomic force microscopy; dAFM; high-resolution; liquids; Introduction Since its inception [1], dynamic atomic force microscopy (dAFM) has proven to be a powerful yet versatile tool capable of operating in media ranging from vacuum to liquids and

Interpreting motion and force for narrow-band intermodulation atomic force microscopy

• Daniel Platz,
• Daniel Forchheimer,
• Erik A. Tholén and
• David B. Haviland

Beilstein J. Nanotechnol. 2013, 4, 45–56, doi:10.3762/bjnano.4.5

• Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip–surface force by measurement of the mixing of multiple modes in a frequency comb. A high-quality factor cantilever resonance and a suitable drive comb will result in tip motion described by a

Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids

• Miriam Jaafar,
• David Martínez-Martín,
• Mariano Cuenca,
• John Melcher,
• Arvind Raman and
• Julio Gómez-Herrero

Beilstein J. Nanotechnol. 2012, 3, 336–344, doi:10.3762/bjnano.3.38

• modulation; noncontact; Introduction Dynamic atomic force microscopy (dAFM) [1][2] is a powerful yet versatile tool capable of operating in environments ranging from ultrahigh vacuum (UHV) to liquids [3][4], and imaging samples ranging from stiff inorganic materials [5] to soft biological matter [6], with

Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique

• Zsolt Majzik,
• Martin Setvín,
• Andreas Bettac,
• Albrecht Feltz,
• Vladimír Cháb and
• Pavel Jelínek

Beilstein J. Nanotechnol. 2012, 3, 249–259, doi:10.3762/bjnano.3.28

• .3.28 Abstract We present the results of simultaneous scanning-tunneling and frequency-modulated dynamic atomic force microscopy measurements with a qPlus setup. The qPlus sensor is a purely electrical sensor based on a quartz tuning fork. If both the tunneling current and the force signal are to be

Manipulation of gold colloidal nanoparticles with atomic force microscopy in dynamic mode: influence of particle–substrate chemistry and morphology, and of operating conditions

• Samer Darwich,
• Karine Mougin,
• Akshata Rao,
• Enrico Gnecco,
• Shrisudersan Jayaraman and
• Hamidou Haidara

Beilstein J. Nanotechnol. 2011, 2, 85–98, doi:10.3762/bjnano.2.10

• behaviour of nanoparticles (NPs) during their assembly. In the present work, we have manipulated bare and functionalized gold nanoparticles on flat and patterned silicon and silicon coated substrates with dynamic atomic force microscopy (AFM). Under ambient conditions, the particles adhere to silicon until